2005 International Conference on Integrated Circuit Design and Technology

2005 International Conference on Integrated Circuit Design and Technology

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... when translated to 2u2 devices, is 20 parts per trillion (ppT) after 10 years of operation at 85AdC. If we allow plasma charging damage to consume 10% of the lifetime, then the measured failure fraction must below 2 ppT. Thus the 2.5% failureanbsp;...


Title:2005 International Conference on Integrated Circuit Design and Technology
Author: Institute of Electrical and Electronics Engineers. Central Texas Section
Publisher:Institute of Electrical & Electronics Engineers(IEEE) - 2005-01-01
ISBN-13:

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